The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 21, 2016
Filed:
Apr. 10, 2014
Fabrice Cancre, Lexington, MA (US);
Ted Michael Shields, Waltham, MA (US);
Jiawei Tan, Bedford, MA (US);
Fabrice Cancre, Lexington, MA (US);
Ted Michael Shields, Waltham, MA (US);
Jiawei Tan, Bedford, MA (US);
OLYMPUS SCIENTIFIC SOLUTIONS AMERICAS INC., Waltham, MA (US);
Abstract
Herein disclosed is an x-ray florescence (XRF) test system which comprises an XRF test instrument used for testing a test target's responses to X-rays, the instrument including a test window allowing the X-ray and its responsive energy to pass through, and at least one window protecting film allowing X-rays to pass through and providing protections to the window, the film being configured to be coupled with the window in a fashion to be removed from or applied or reapplied over the window. The corresponding calibration mode can be manually or automatically applied according to the specific film presently in use.