The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 21, 2016

Filed:

Jun. 25, 2014
Applicant:

Fluxdata, Inc., Rochester, NY (US);

Inventors:

Lawrence A. Taplin, Rochester, NY (US);

Pano A. Spiliotis, Rochester, NY (US);

Assignee:

FluxData, Inc., Rochester, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/25 (2006.01); G01J 3/51 (2006.01);
U.S. Cl.
CPC ...
G01J 3/51 (2013.01); G01N 2223/422 (2013.01);
Abstract

An apparatus for spatially characterizing an illumination source of interest in a scene comprised of at least one optical element configured to form an image on a focal plane; a single plane sensing array comprising at least two types of pixels having different spectral sensitivity bands, the pixels located at spatially non-overlapping regions of the sensing array; a multi-bandpass filter spectrally narrowing light received from the scene within at least two of the different spectral sensitivity bands corresponding to features that distinguish the illumination source of interest from other sources in the scene; and a processor in signal communication with the sensing array and containing an algorithm to interpolate at least two levels of signals received from at least one spatial location on the sensing array and to determine the presence of the specific illumination source of interest from the relative intensities of the two levels.


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