The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 21, 2016
Filed:
Feb. 07, 2013
Ihi Corporation, Koto-ku, Tokyo, JP;
Michiko Baba, Tokyo, JP;
Kouzou Hasegawa, Tokyo, JP;
Yuuichi Miura, Tokyo, JP;
Norimasa Taga, Tokyo, JP;
Tooru Fujii, Tokyo, JP;
IHI Corporation, Tokyo, JP;
Abstract
An inner diameter measuring device () for measuring an inner diameter of a hollow object to be measured, wherein the inner diameter measuring device comprises a circulation unit () and a measuring head () and is insertable into inside of an object to be measured, wherein the measuring head has a contact measuring unit () for measuring the inner diameter by contacting an inner surface of the object to be measured and an advancing/retreating unit () for making the contact measuring unit to advance and to retreat in a radial direction, and wherein the circulation unit can rotate the measuring head around a center line () of the inner diameter measuring device.