The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 21, 2016

Filed:

Aug. 12, 2015
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventor:

Hiroyuki Sasayama, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 2/21 (2006.01); B41J 29/393 (2006.01);
U.S. Cl.
CPC ...
B41J 29/393 (2013.01); B41J 2/2135 (2013.01); B41J 2/2146 (2013.01); B41J 2/2142 (2013.01); B41J 2029/3935 (2013.01);
Abstract

Dot patterns are recorded on a recording medium at intervals determined in advance in a second direction using first and second head modules while relatively moving a recording head and the recording medium in the second direction. The dot patterns are optically read, and a density profile representing change in density in the second direction of a read image of the dot patterns is calculated. A repetition period of a waveform corresponding to each dot pattern in the density profile is calculated, and data of the density profile is integrated and averaged in each repetition period to calculate an integrated density profile. A peak position of a waveform corresponding to each dot pattern in the integrated density profile is obtained, and the amount of positional deviation is calculated based on each peak position.


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