The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 21, 2016
Filed:
Oct. 04, 2013
Marius G. Linguraru, Washington, DC (US);
Carlos S. Mendoza, Washington, DC (US);
Nabile Safdar, Laurel, MD (US);
Gary F. Rogers, Great Falls, VA (US);
Marius G. Linguraru, Washington, DC (US);
Carlos S. Mendoza, Washington, DC (US);
Nabile Safdar, Laurel, MD (US);
Gary F. Rogers, Great Falls, VA (US);
Other;
Abstract
A technique for performing computational analysis of craniosynostosis from CT images is discussed. An image-computing platform assesses craniofacial malformations by using a shape analysis methodology for image processing. The shape of a patient's craniofacial anatomy is assessed in terms of a statistical shape model that incorporates normal shape variability. The model allows for the identification of a closest normal variant to a patient's anatomy rather than comparing the patient's anatomy to an age-specific average shape. Further, an image registration and segmentation method is discussed which enables obtaining a personalized anatomical model for each patient, thereby achieving a precise and systematic characterization of shape abnormality. Visual (qualitative) and quantitative surgical planning, as well as pre-operative and post-operative assessments are achieved. Further, automatic surgical planning for cranial vault reconstruction using tessellation algorithms to establish the relationship between patient's anatomy and the closest normal variant is discussed.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile