The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 21, 2016

Filed:

Oct. 25, 2013
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Hiroyoshi Tanaka, Tokyo, JP;

Futoshi Hirose, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01); A61B 3/02 (2006.01);
U.S. Cl.
CPC ...
A61B 3/14 (2013.01);
Abstract

An adaptive optics (AO) optical system is used, to perform accurate alignment between the AO optical system and a subject's eye. An ophthalmologic apparatus according to the present invention includes a positional relationship change unit (e.g., a driving mechanism including a stage for moving the apparatus) configured to change a positional relationship between a subject's eye and an optical system including an aberration measurement unit (e.g., a Shack-Hartmann wavefront sensor) in a first irradiation state of the subject's eye with measurement light, and an irradiation state change unit (e.g., a mechanism for changing an irradiation position) configured to change an irradiation state of the subject's eye with the measurement light from the first irradiation state to a second irradiation state for correcting an aberration of the subject's eye based on a measurement result of the aberration measurement unit.


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