The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2016
Filed:
Jan. 13, 2014
Qualcomm Incorporated, San Diego, CA (US);
Can Zhao, San Diego, CA (US);
Kuo-Chun Lee, San Diego, CA (US);
Sivaramakrishna Veerepalli, San Diego, CA (US);
Arnaud Meylan, San Diego, CA (US);
David William Craig, San Diego, CA (US);
Tiruvaiyaru Kothandaraman Krishnaswamy, Saratoga, CA (US);
Jay Kumar Sundararajan, San Diego, CA (US);
Niranjan Ramesh Pendharkar, San Diego, CA (US);
Gerardo Giaretta, San Diego, CA (US);
Thomas Matthew Rebman, Boulder, CO (US);
Vinod Nagarajan, Saratoga, CA (US);
Sha Hua, San Diego, CA (US);
Satashu Goel, San Diego, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
Methods, systems, and devices are described for determining a quality estimation of a wireless network that may be used to determine whether a particular wireless network meets one or more criteria for association with a station. The quality estimation may be based on a load quality of a basic service set (BSS) of an available wireless network and/or one or more wide area network (WAN) metrics associated with the wireless network. A station may evaluate such load quality and WAN metrics prior to association, and/or after association with a wireless network.