The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 14, 2016

Filed:

Aug. 23, 2015
Applicant:

Global Technology Associates, Llc, Reston, VA (US);

Inventors:

Sandip Sandhu, San Diego, CA (US);

Behrouz Heshmatipour, Alisa Viejo, CA (US);

Dmitry Kondrashuk, Poway, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/02 (2009.01); H04W 24/04 (2009.01); H04W 16/00 (2009.01); H04W 36/00 (2009.01); H04W 24/08 (2009.01);
U.S. Cl.
CPC ...
H04W 24/08 (2013.01);
Abstract

A method of identifying idiosyncratic performance-outliers amongst a plurality of cell-sites in a wireless network, the method comprising: selecting cell-sites; selecting, for each cell-site, at least one sector-carrier; selecting, for each sector-carrier, one or more KPIs; determining, for each KPI, a historical value and a recent value based on samples of the KPI taken during a historical period and a recent period, respectively, the recent period being a subset of the historical period; determining, for each KPI, a delta representing a difference between the historical value and the recent value thereby determining KPI-specific sets of deltas, respectively; normalizing each set of deltas; selecting, for each set of deltas, a KPI-specific threshold; comparing, for each set of deltas, members thereof against the corresponding threshold; and identifying, for each set of deltas, which combinations of cell-site and sector-carrier are KPI-specific performance outliers based on the comparison, respectively.


Find Patent Forward Citations

Loading…