The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 14, 2016

Filed:

Feb. 26, 2014
Applicant:

Kabushiki Kaisha Topcon, Itabashi-ku, Tokyo-to, JP;

Inventors:

Kaoru Kumagai, Tokyo-to, JP;

Hitoshi Otani, Tokyo-to, JP;

Naoto Kasori, Tokyo-to, JP;

You Sasaki, Tokyo-to, JP;

Jun Sasagawa, Tokyo-to, JP;

Nobuyuki Fukaya, Tokyo-to, JP;

Assignee:

Kabushiki Kaisha TOPCON, Tokyo-to, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/02 (2006.01); G01C 3/00 (2006.01); G01C 11/06 (2006.01);
U.S. Cl.
CPC ...
H04N 13/0275 (2013.01); G01C 3/00 (2013.01); G01C 11/06 (2013.01);
Abstract

A measuring instrument comprises an spherical camera () for acquiring image data over total circumference, a laser scanner () installed integrally with the spherical camera and for acquiring point cloud data of the surroundings, a synchronous control unit () for controlling acquisition of data of the spherical camera and the laser scanner, a storage unit () for recording the image data and the point cloud data, an absolute scale acquiring means for acquiring an absolute scale for obtaining an absolute position of when images are photographed by the spherical camera, and a control arithmetic unit (), wherein the control arithmetic unit calculates a 3D model based on the image data, the point cloud data, and the absolute position.


Find Patent Forward Citations

Loading…