The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2016
Filed:
Jun. 29, 2015
Skybox Imaging, Inc., Mountain View, CA (US);
Chwen-Yuan Ku, San Jose, CA (US);
H. Keith Nishihara, Los Altos, CA (US);
M. Dirk Robinson, Menlo Park, CA (US);
Skybox Imaging, Inc., Mountain View, CA (US);
Abstract
Examples of systems and methods to provide estimates of dark current for pixels of a photosensor as a function of the temperature of the sensor and the gain applied to the photosensor are described. In various implementations, the dark current estimated for each pixel can depend at least partly on a global scale factor and a global bias that depend on temperature and gain and a temperature-independent and gain-independent offset value for each pixel. The scale, bias, and offsets may be determined from multiple dark field images taken by the sensor over a range of operating temperatures. In some cases, the scale and bias can be determined using a subset of less than all the image pixels. Scale and bias derived for a particular sensor can be used in the calibration of different sensors.