The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2016
Filed:
Mar. 05, 2013
Ixia, Calabasas, CA (US);
Lester Noel Stott, Aloha, OR (US);
David Jennings Wicker, Jr., Hillsboro, OR (US);
Jeffrey Dean Marker, Sherwood, OR (US);
Alexander David Rekow, Portland, OR (US);
Timothy Earl Bennington-Davis, Tualatin, OR (US);
Thomas Alexander, Mulino, OR (US);
IXIA, Calabasas, CA (US);
Abstract
Systems and methods are disclosed herein to provide communication test systems for the testing of packet data communication devices, systems and networks. According to one aspect of the subject matter described herein, a test system containing an integrated traffic, protocol and waveform analyzer is disclosed that includes a traffic generator/analyzer and a protocol engine that triggers a waveform analyzer to analyze the signal waveform of a device under test at a predetermined point. Such a test system may offer improved capabilities such as a more selective and accurate measurement of complex signal waveforms, more automated measurements of waveforms pertaining to wireless communication data streams, and more rapid identification and measurement of waveforms corresponding to errored packets.