The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 14, 2016

Filed:

Feb. 27, 2015
Applicants:

Mitsubishi Electric Research Laboratories, Inc., Cambridge, MA (US);

Mitsubishi Electric Corporation, Chiyoda-ku, Tokyo, JP;

Inventors:

Keisuke Kojima, Weston, MA (US);

Toshiaki Koike-Akino, Malden, MA (US);

Yuichiro Horiguchi, Tokyo, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/64 (2013.01); H04B 10/079 (2013.01);
U.S. Cl.
CPC ...
H04B 10/07957 (2013.01); H04B 10/64 (2013.01);
Abstract

A system for measuring a linewidth of an optical signal includes an optical sensor determining a set of measurements of the linewidth of the optical signal propagated over different distances. Each measurement corresponds to a different distance, and includes a white frequency modulation (FM) noise and a low frequency FM noise. The system also includes a processor for determining values of the white FM noise and the LF FM noise reducing a difference between the measurements and values of the linewidth of the optical signal calculated for the different distances with the values of the white FM noise and the LF FM noise.


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