The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2016
Filed:
Jul. 17, 2014
Applicant:
SK Hynix Memory Solutions Inc., San Jose, CA (US);
Inventors:
Yu Kou, San Jose, CA (US);
Lingqi Zeng, San Jose, CA (US);
Assignee:
SK Hynix Memory Solutions Inc., San Jose, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G11C 29/08 (2006.01); G06F 11/10 (2006.01); G06F 11/22 (2006.01); G11C 29/10 (2006.01); H03M 13/01 (2006.01); H03M 13/11 (2006.01); G06F 11/07 (2006.01); G11C 29/52 (2006.01);
U.S. Cl.
CPC ...
G11C 29/08 (2013.01); G06F 11/076 (2013.01); G06F 11/1008 (2013.01); G06F 11/2215 (2013.01); G11C 29/10 (2013.01); G11C 29/52 (2013.01); H03M 13/01 (2013.01); H03M 13/1102 (2013.01);
Abstract
An amount of time and an error rate function are received, where the error rate function defines a relationship between a number of iterations associated with iterative decoding and an error rate. A testing error rate is determined based at least in part on the amount of time. The number of iterations which corresponds to the testing error rate in the error rate function is selected to be a testing number of iterations; the testing error rate and the testing number of iterations are associated with testing storage media using iterative decoding.