The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2016
Filed:
Sep. 13, 2011
Cristian Lorenz, Hamburg, DE;
Hans Barschdorf, Dassendorf, DE;
Tobias Klinder, Briarcliff Manor, NY (US);
Raghed Hanna, Kobienz, DE;
Cristian Lorenz, Hamburg, DE;
Hans Barschdorf, Dassendorf, DE;
Tobias Klinder, Briarcliff Manor, NY (US);
Raghed Hanna, Kobienz, DE;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
A system () for segmenting an object in an image adapts a first model for segmenting the object to the image. A feature is extracted from the image based on the adapted first model. A second model is selected for segmenting the object from a plurality of models for segmenting the object, based on the feature extracted from the image. The second model includes additional detail of the object. The second model is utilized based on the adapted first model and/or the feature extracted from the image; the initialized second model is adapted to the image. The features extracted from the image based on the adapted first model help the system () to select the second model for segmenting the object from a plurality of models for segmenting the object. The adapted first model and/or the extracted features are also used for initializing the second model. Because the second model includes the additional detail of the object, the segmentation result using the second model is more complete than the segmentation result Obtained using the first model. Moreover, the initialization of the second model based on the adapted first model and/or the detected features Improves the accuracy of the second model adaptation.