The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2016
Filed:
Mar. 30, 2015
Applicant:
Navico Holding As, Egersund, NO;
Inventors:
Michael Lauenstein, Eagan, MN (US);
Matthew Johnson, Roseville, MN (US);
Assignee:
NAVICO HOLDINGS AS, Egersund, NO;
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01); G06F 17/30 (2006.01); G01B 5/18 (2006.01); G01V 1/28 (2006.01); G01V 1/38 (2006.01); G01S 15/89 (2006.01); G01V 99/00 (2009.01); G06F 17/50 (2006.01); G06T 17/05 (2011.01); G01S 7/56 (2006.01); G06K 9/00 (2006.01); G06T 7/00 (2006.01); G06T 11/20 (2006.01); G06T 11/60 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30241 (2013.01); G01B 5/18 (2013.01); G01S 7/56 (2013.01); G01S 15/89 (2013.01); G01S 15/8902 (2013.01); G01V 1/282 (2013.01); G01V 1/3808 (2013.01); G01V 99/005 (2013.01); G06F 17/30563 (2013.01); G06F 17/5004 (2013.01); G06F 17/5009 (2013.01); G06F 17/509 (2013.01); G06K 9/00476 (2013.01); G06T 7/0051 (2013.01); G06T 11/20 (2013.01); G06T 11/60 (2013.01); G06T 17/05 (2013.01); G01V 2210/10 (2013.01); G01V 2210/64 (2013.01);
Abstract
A method of processing geo-statistical data includes piloting a watercraft with a monitoring system on a water body, taking measurements of a depth of the water body and the position of the watercraft using the monitoring system, and aligning the depth measurements with the position measurements. The method also includes creating a contour map from the depth and position measurements, creating a polygon on the contour map, and analyzing at least one of the depth and position measurements within the polygon.