The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 14, 2016

Filed:

Oct. 02, 2013
Applicant:

Accenture Global Services Limited, Dublin, IE;

Inventors:

Kunal Taneja, San Jose, CA (US);

Teresa Tung, San Jose, CA (US);

Mijung Kim, Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 11/36 (2006.01); G06F 9/52 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01); G06F 9/52 (2013.01);
Abstract

A system comprehensively tests each feasible path in a policy-based Extensible Markup Language (XML) workflow. The system may receive an input workflow and parse workflow (or proxy code of the workflow) to construct a policy control flow graph. The system may identify paths in the policy control flow graph, such as each feasible path in the policy control flow graph. The system may determine path constraints for the identified paths, where the path constraints identify path conditions for traversing the identified path in the policy control flow graph. Then, the system may generate a set of test inputs for the workflow using the path constraints that, when input into the policy-based XML workflow, cause the workflow to traverse the identified paths.


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