The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 14, 2016

Filed:

Oct. 13, 2014
Applicant:

Nec Laboratories America, Inc., Princeton, NJ (US);

Inventors:

Junghwan Rhee, Princeton, NJ (US);

Hui Zhang, Princeton Junction, NJ (US);

Nipun Arora, Plainsboro, NJ (US);

Guofei Jiang, Princeton, NJ (US);

Chung Hwan Kim, West Lafayette, IN (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3636 (2013.01);
Abstract

Methods and systems for performance inference include inferring an internal application status based on a unified call stack trace that includes both user and kernel information by inferring user function instances. A calling context encoding is generated that includes information regarding function calling paths. Application performance is analyzed based on the encoded calling contexts. The analysis includes performing a top-down latency breakdown and ranking calling contexts according to how costly each function calling path is.


Find Patent Forward Citations

Rhee, Junghwan. (2016). Transparent performance inference of whole software layers and context-sensitive performance debugging (U.S. Patent No. 9367428). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9367428

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…