The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2016
Filed:
Mar. 05, 2013
International Business Machines Corporation, Armonk, NY (US);
Charles W. Gainey, Jr., Poughkeepsie, NY (US);
Marcel Mitran, Markham, CA (US);
Chung-Lung K. Shum, Wappingers Falls, NY (US);
Kevin Stoodley, Richmond Hill, CA (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
The invention relates to implementing run-time instrumentation directed sampling. An aspect of the invention includes a method for implementing run-time instrumentation directed sampling. The method includes fetching a run-time instrumentation next (RINEXT) instruction from an instruction stream. The instruction stream includes the RINEXT instruction followed by a next sequential instruction (NSI) in program order. The method further includes executing the RINEXT instruction by a processor. The executing includes determining whether a current run-time instrumentation state enables setting a sample point for reporting run-time instrumentation information during program execution. Based on the current run-time instrumentation state enabling setting the sample point, the NSI is a sample instruction for causing a run-time instrumentation event. Based on executing the NSI sample instruction, the run-time instrumentation event causes recording of run-time instrumentation information into a run-time instrumentation program buffer as a reporting group.