The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2016
Filed:
Nov. 26, 2012
Fanuc Corporation, Yamanashi, JP;
Hikaru Yamane, Yamanashi, JP;
Yasuo Arakawa, Yamanashi, JP;
FANUC CORPORATION, Yamanashi, JP;
Abstract
A measurement program for sequentially measuring measurement points, which are to be measured with a touch sensor, is created on the basis of a machining program, which is read in, for machining a turning tool. Then, the rake face height is measured on each of the measurement points and the measurement data is stored. Subsequently, a calculation method of a correction amount is selected so as to calculate the correction amount, and whether or not the calculated correction amount is smaller than a regulation value is determined. The machining program is modified on the basis of the correction amount when the correction amount is not smaller than the regulation value, while the machining program is modified on the basis of the correction amount in accordance with the selected method when the correction amount is smaller than the regulation value.