The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2016
Filed:
Jul. 01, 2015
Kenji Morita, Tokyo, JP;
Nobuyuki Satoh, Kanagawa, JP;
Mamoru Yorimoto, Kanagawa, JP;
Masayuki Fujii, Kanagawa, JP;
Daisaku Horikawa, Kanagawa, JP;
Suguru Yokozawa, Kanagawa, JP;
Masahiro Hiranuma, Kanagawa, JP;
Masaya Kawarada, Kanagawa, JP;
Kenji Morita, Tokyo, JP;
Nobuyuki Satoh, Kanagawa, JP;
Mamoru Yorimoto, Kanagawa, JP;
Masayuki Fujii, Kanagawa, JP;
Daisaku Horikawa, Kanagawa, JP;
Suguru Yokozawa, Kanagawa, JP;
Masahiro Hiranuma, Kanagawa, JP;
Masaya Kawarada, Kanagawa, JP;
RICOH COMPANY, LTD., Tokyo, JP;
Abstract
An imaging device includes: a housing having an opening in a surface thereof facing a subject; a light source that irradiates the subject with light; a two-dimensional image sensor that captures, from inside of the housing through the opening; an image of the subject illuminated by the light source; an optical member that is disposed between the two-dimensional image sensor and the opening and that transmits light reflected off the subject; and a contamination inspection member that is disposed between the opening and the optical member and that causes inspection light for inspecting contamination on the optical member to be incident upon the two-dimensional image sensor via the optical member.