The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 14, 2016

Filed:

Dec. 02, 2014
Applicants:

Boe Technology Group Co., Ltd., Beijing, CN;

Beijing Boe Optoelectronics Technology Co., Ltd., Beijing, CN;

Inventor:

Mi Zhang, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/1333 (2006.01); G02F 1/1362 (2006.01); G02F 1/13 (2006.01); H01L 27/12 (2006.01); G02F 1/1343 (2006.01); G02F 1/1368 (2006.01);
U.S. Cl.
CPC ...
G02F 1/136286 (2013.01); G02F 1/1309 (2013.01); G02F 1/1368 (2013.01); G02F 1/134336 (2013.01); G02F 1/136259 (2013.01); H01L 27/12 (2013.01); H01L 27/124 (2013.01); H01L 27/1214 (2013.01); G02F 2001/134345 (2013.01); G02F 2001/136254 (2013.01);
Abstract

A thin film transistor liquid crystal display (TFT-LCD) array substrate comprises a display area comprising a gate line, a data line and a common electrode line, a pixel electrode and a first thin film transistor (TFT) formed in each sub-pixel area defined by the gate line and data line which are crossed with each other; and a test area located at the peripheral of the display area and comprising a first test one, a second test line, a testing electrode and a second TFT, and the common electrode line extending to the test area from the display area, wherein a part of the second test line constitutes a gate electrode of the second TFT; the source electrode of the second TFT is electrically connected with the first test line; a drain of the second TFT is electrically connected with the common electrode fine; and the common electrode line is connected with the testing electrode.


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