The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2016
Filed:
Sep. 30, 2014
Olympus Corporation, Shibuya-ku, Tokyo, JP;
Yusuke Yamashita, Hino, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
A desired observation timing is ensured, and simultaneity of observation among different observation positions is ensured. Provided is a microscope system including an electrically powered stage, a scanner, objective lenses, a revolver, an image-acquisition portion, an autofocus portion, a first storage portion that stores one of the focal positions of the low-magnification objective lens as a reference position, a focal-position setting portion that sets a focal position at which an image is acquired with reference to the reference position for the low-magnification objective lens, an acquisition-position setting portion that sets acquisition positions for partial images, and a map-image generating portion that generates a map image based on the partial images acquired at the set focal position, wherein the autofocus portion detects a focal position of the high-magnification objective lens at an observation position set on the map image with reference to the reference position for the low-magnification objective lens.