The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 14, 2016

Filed:

Jan. 15, 2013
Applicant:

Ut-battelle, Llc, Oak Ridge, TN (US);

Inventors:

Lloyd G. Clonts, Knoxville, TN (US);

Yacouba Diawara, Oak Ridge, TN (US);

Cornelius Donahue, Jr., Knoxville, TN (US);

Christopher A. Montcalm, Oak Ridge, TN (US);

Richard A. Riedel, Knoxville, TN (US);

Theodore Visscher, Powell, TN (US);

Assignee:

UT-BATTELLE, LLC, Oak Ridge, TN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 3/06 (2006.01);
U.S. Cl.
CPC ...
G01T 3/06 (2013.01);
Abstract

For each photomultiplier tube in an Anger camera, an R×S array of preamplifiers is provided to detect electrons generated within the photomultiplier tube. The outputs of the preamplifiers are digitized to measure the magnitude of the signals from each preamplifier. For each photomultiplier tube, a corresponding summation circuitry including R row summation circuits and S column summation circuits numerically add the magnitudes of the signals from preamplifiers for each row and for each column to generate histograms. For a P×Q array of photomultiplier tubes, P×Q summation circuitries generate P×Q row histograms including R entries and P×Q column histograms including S entries. The total set of histograms include P×Q×(R+S) entries, which can be analyzed by a position calculation circuit to determine the locations of events (detection of a neutron).


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