The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 14, 2016

Filed:

Aug. 14, 2014
Applicants:

Ching-sheng Chang, Hsin-Chu, TW;

Yuan-min HU, Hsin-Chu, TW;

Inventors:

Ching-Sheng Chang, Hsin-Chu, TW;

Yuan-Min Hu, Hsin-Chu, TW;

Assignee:

Faraday Technology Corp., Science-Based Industrial Park, Hsin-Chu, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31725 (2013.01); G01R 31/31727 (2013.01);
Abstract

A method and apparatus for performing de-skew control are provided, where the method is applied to an electronic device. The method includes the steps of: performing a symbol detection at a plurality of lanes of the electronic device, respectively, to determine locations of a specific symbol at the plurality of lanes, respectively; according to the locations of the specific symbol at the plurality of lanes, selectively rearranging decoded data in the plurality of lanes to generate a plurality of sets of de-skewed data respectively corresponding to the plurality of lanes; and by buffering the plurality of sets of de-skewed data, selectively delaying output of the plurality of sets of de-skewed data to control beginning of the plurality of sets of de-skewed data to be simultaneously output.


Find Patent Forward Citations

Loading…