The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2016
Filed:
Sep. 08, 2014
Applicant:
Li-cor, Inc., Lincoln, NE (US);
Inventors:
Ahmed Bouzid, Lincoln, NE (US);
Chris Lesiak, Lincoln, NE (US);
Assignee:
LI-COR, Inc., Lincoln, NE (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); G02B 17/06 (2006.01); G02B 13/22 (2006.01); G02B 21/16 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6458 (2013.01); G02B 13/22 (2013.01); G02B 17/0605 (2013.01); G02B 21/16 (2013.01); G02B 21/361 (2013.01); G01N 2021/6463 (2013.01); G01N 2201/06113 (2013.01); G01N 2201/1053 (2013.01);
Abstract
Quantitative fluorescence imaging systems and methods using angular illumination to obtain automatic focus information. Laser scanning (e.g., point or line scanning) with angular illumination in combination with an area imaging sensor, such as with a bi-telcentric scanner, is used to determine sample height (relative to a detection axis orthogonal to a platform holding the sample) and also correct for sample height in subsequent scans.