The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2016
Filed:
Dec. 08, 2009
Jacques Delaire, Palaiseau, FR;
Isabelle Leray, Issy les Moulineaux, FR;
Jean-pierre Lefevre, Puteaux, FR;
Liyun Zhao, Oxford, GB;
Ting Wu, Cachan, FR;
Jacques Delaire, Palaiseau, FR;
Isabelle Leray, Issy les Moulineaux, FR;
Jean-Pierre Lefevre, Puteaux, FR;
Liyun Zhao, Oxford, GB;
Ting Wu, Cachan, FR;
Abstract
Process for metering lead in a sample of original water, in which is placed a sample of the water of which at least a substantial portion of the colloidal and organic material is passed in solution (sample of pretreated water), having: a first stage, starting from a sample of pretreated water with an adjusted pH, the lead is concentrated and the other parasitic ions are at least partially eliminated to obtain a sample of water that is concentrated with lead and substantially lacking in other parasitic ions (sample of lead-concentrated water); and a second stage in which, starting from the sample of lead-concentrated water, the sample of lead-concentrated water is mixed with a selective, lead-sensitive fluorescent probe whose fluorescence intensity/lead metering function is known; then, the thus produced water/fluorescent probe mixture is excited by the light, and the fluorescence intensity of the thus excited water/fluorescent probe mixture is collected optically; finally, starting from the thus detected fluorescence intensity, the lead metering of the sample to be metered is determined based on the fluorescence intensity/lead metering function.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile