The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2016
Filed:
May. 27, 2014
Applicant:
Olympus Corporation, Shibuya-ku, Tokyo, JP;
Inventors:
Yosuke Tamura, Kawaguchi, JP;
Toshiya Komuro, Tokyo, JP;
Assignee:
OLYMPUS CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/04 (2006.01); G01J 1/42 (2006.01); G02B 7/28 (2006.01); G02B 21/24 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
G01J 1/42 (2013.01); G01B 9/04 (2013.01); G01J 1/4257 (2013.01); G02B 7/28 (2013.01); G02B 21/247 (2013.01); G02B 21/0092 (2013.01);
Abstract
A focusing device that includes a differential interference prism used in differential interference observation in a focusing detection optical system includes: a light source that emits light with which a measurement surface of an observation sample is irradiated; a photo detection unit that detects light from the measurement surface; a focusing detection unit that detects an error signal near a focusing point of the measurement surface on the basis of an output signal from the photo detection unit; and a condition changing unit that changes an acquisition condition of the error signal.