The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2016
Filed:
Dec. 19, 2012
Opticul Diagnostics Ltd., Hertzilia Pituach, IL;
Opticul Diagnostics Inc., Rockville, MD (US);
Gallya Gannot, Rockville, MD (US);
Dror Lederman, Qiryat Gat, IL;
Hassan Moinuddin, Bristow, VA (US);
Israel Gannot, Ramat Hasharon, IL;
OPTICUL DIAGNOSTICS LTD., Hertzilia Pituach, IL;
OPTICUL DIAGNOSTICS INC., Rockville, MD (US);
Abstract
A spectroscopic method for spectroscopic detection and identification of bacteria in culture is disclosed. The method incorporates construction of at least one data set, which may be a spectrum, interference pattern, or scattering pattern, from a cultured sample suspected of containing said bacteria. The data set is corrected for the presence of water in the sample, spectral features are extracted using a principal components analysis, and the features are classified using a learning algorithm. In some embodiments of the invention, for example, to differentiate MRSA from MSSA, a multimodal analysis is performed in which identification of the bacteria is made based on a spectrum of the sample, an interference pattern used to determine cell wall thickness, and a scattering pattern used to determine cell wall roughness. An apparatus for performing the method is also disclosed, one embodiment of which incorporates a multiple sample analyzer.