The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2016
Filed:
Sep. 19, 2014
Ion Beam Applications, S.a., Lovuain-la-Neuve, BE;
Technische Universität Dresden, Dresden, DE;
Helmholtz-zentrum Dresden-rossendorf E.v., Dresden, DE;
Guntram Pausch, Dresden, DE;
Christian Golnik, Dresden, DE;
Wolfgang Enghardt, Ullersdorf, DE;
Guillaume Janssens, Ottignies-Louvain-la-Neuve, BE;
Damien Prieels, Court-Saint-Etienne, BE;
Julien Smeets, Bouge, BE;
Francois Vander Stappen, Brussels, BE;
ION BEAM APPLICATIONS, S.A., Louvain-la-Neuve, DE;
TECHNISCHE UNIVERSITAT DRESDEN, Dresden, DE;
HELMHOLTZ-ZENTRUM DRESDEN-ROSSENDORF E.V., Dresden, DE;
Abstract
The invention is related to a method for monitoring a range of a particle beam in a target. The method is using gamma detectors for detecting prompt gammas produced in the target. The time differences between the time of detecting a gamma quantum and a time of emission of a particle or a bunch of particles from the radiation device are determined. A statistical distribution of those time difference is used to deduce information related to the range of the beam. The invention is also related to an apparatus for monitoring a range based on measured time profiles of detected prompt gammas.