The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 14, 2016

Filed:

Nov. 22, 2013
Applicant:

Hitachi Medical Corporation, Tokyo, JP;

Inventor:

Yasuhiro Kamada, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/055 (2006.01); G01R 33/565 (2006.01); G01R 33/56 (2006.01); G01R 33/561 (2006.01);
U.S. Cl.
CPC ...
A61B 5/055 (2013.01); G01R 33/56509 (2013.01); G01R 33/5602 (2013.01); G01R 33/5607 (2013.01); G01R 33/5613 (2013.01);
Abstract

In order to make it possible to set the optimal breath-holding imaging conditions according to the subject without extension of an imaging time or the sacrifice of image quality, one scan is divided into one or more breath-holding measurements and free-breathing measurements on the basis of the imaging conditions of a breath-holding measurement, which are input and set according to the subject, and a region of the k space measured in the breath-holding measurement is controlled. Preferably, in the breath-holding measurement, low-frequency data of the k space is measured. Moreover, preferably, imaging conditions of the breath-holding measurement include the number of times of breath holding or a breath-holding time, and the operator can set any of these values.


Find Patent Forward Citations

Loading…