The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2016
Filed:
Oct. 31, 2006
Cynthia J. Roberts, Columbus, OH (US);
Cynthia J. Roberts, Columbus, OH (US);
CRS & Associates, Columbus, OH (US);
Abstract
Embodiments of the invention are generally directed to apparatus and methods for measuring a deformation characteristic of a deformable target surface. The measurement principles of the invention may be applied to a large variety of organic (e.g., human, animal or plant tissue) and inorganic materials having a surface that can be deformed by an applied non-contact force. The surface may be light diffusing and non-transparent or non-diffusing and transparent. An illustrative embodiment of the invention is directed to a device for measuring a deformation characteristic of a cornea. The device comprises a corneal topographer and a non-contact tonometer that is operationally integrated with the corneal topographer. In an aspect, the corneal topographer is a rasterstereography-based topographer. Use of the inventive device enables a method for measuring a deformation characteristic of the cornea. In addition to the measurable deformation characteristics listed above, dioptric power, intraocular pressure, corneal hysteresis, corneal elasticity, corneal viscosity and various known corneal topography characteristics can be measured.