The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 14, 2016

Filed:

May. 16, 2012
Applicant:

Takumi Uchiyama, Tokyo, JP;

Inventor:

Takumi Uchiyama, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01); A61B 3/135 (2006.01);
U.S. Cl.
CPC ...
A61B 3/135 (2013.01);
Abstract

A slit lamp microscope capable of appropriately and easily carrying out the setting of the optical system is provided. In storageof a slit lamp microscope, correspondence informationis stored in which standard setting conditions of an illumination systemand/or an observation systemare associated with each of multiple sites of an eye E. A searching partsearches the standard setting conditions corresponding to a site designated by an operation partfrom the correspondence information. A setting-state acquiring partacquires current setting states of the illumination systemand/or the observation system. A setting-state specifying part specifies, from among the current setting states acquired by the setting-state acquiring part, those differing from the standard setting conditions searched by the searching part. A controller displays information based on this specified result on the display


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