The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2016

Filed:

Nov. 13, 2014
Applicant:

Futurewei Technologies Inc., Plano, TX (US);

Inventors:

Wei Jiang, Bridgewater, NJ (US);

Jinwei Gu, Bridgewater, NJ (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/265 (2006.01); G06T 5/00 (2006.01); G06T 11/60 (2006.01);
U.S. Cl.
CPC ...
H04N 5/265 (2013.01); G06T 5/006 (2013.01); G06T 11/60 (2013.01);
Abstract

An apparatus is configured to perform a method of parallax tolerant video stitching. The method includes determining a plurality of video sequences to be stitched together; performing a spatial-temporal localized warping computation process on the video sequences to determine a plurality of target warping maps; warping a plurality of frames among the video sequences into a plurality of target virtual frames using the target warping maps; performing a spatial-temporal content-based seam finding process on the target virtual frames to determine a plurality of target seam maps; and stitching the video sequences together using the target seam maps.


Find Patent Forward Citations

Jiang, Wei. (2016). Parallax tolerant video stitching with spatial-temporal localized warping and seam finding (U.S. Patent No. 9363449). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9363449

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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