The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2016
Filed:
Nov. 09, 2011
Yifei Zhang, Milpitas, CA (US);
Gregory Burd, San Jose, CA (US);
Yifei Zhang, Milpitas, CA (US);
Gregory Burd, San Jose, CA (US);
Marvell International Ltd., Hamilton, BM;
Abstract
In nonbinary iterative decoding, a data recovery scheme corrects for corrupted or defective data by determining reliability metrics for blocks of decoded nonbinary data. Block or windowed detectors generate block reliability metrics for data blocks (rather than individual bits) of decoded data using soft information from the regular decoding mode or from new iterative decoding iterations performed during defect detection mode. A defect detection system triggers corrective decoding of selected data blocks based on the block reliability metrics, by for example, comparing the block reliability metrics to a threshold or by selecting an adjustable number of the least reliable data blocks.