The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2016
Filed:
Jan. 03, 2013
Ii-vi Incorporated, Saxonburg, PA (US);
Ian Peter McClean, Brixham, GB;
Peter Wigley, Coming, NY (US);
II-VI Incorporated, Saxonburg, PA (US);
Abstract
A method and apparatus for monitoring and controlling an optical node. The optical nodeincluding one or more optical componentsorconnected by optical fiber carrying an optical signal. The optical signalincluding a plurality of optical channels. A set of measurement sequences is determined, each measurement sequence defining a set of optical channels from the plurality of optical channels and a measuring sequence for measuring an optical property of the set of optical channels. A measurement sequence is selected from the set of measurement sequences based on the operating conditions of the optical node. The optical properties of the set of optical channels of the selected measurement sequence are measured. The measured optical properties are analyzed to determine whether one or more optical componentsorare causing the optical nodeto operate outside the tolerance of a defined set of operating conditions. The operation of the determined optical componentsorare adjusted to enable the optical nodeto operate in accordance with the defined set of operating conditions. An optical performance monitor is also provided for use with the method and apparatus.