The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2016

Filed:

Jun. 25, 2015
Applicant:

Renesas Electronics Corporation, Kanagawa, JP;

Inventors:

Takaya Yamamoto, Kawasaki, JP;

Hideo Nakane, Kawasaki, JP;

Keisuke Kimura, Kawasaki, JP;

Yuichi Okuda, Kawasaki, JP;

Takashi Oshima, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/12 (2006.01); H03M 1/00 (2006.01); H03M 1/06 (2006.01); H03M 1/46 (2006.01); H03M 1/10 (2006.01);
U.S. Cl.
CPC ...
H03M 1/002 (2013.01); H03M 1/0609 (2013.01); H03M 1/1009 (2013.01); H03M 1/462 (2013.01); H03M 1/468 (2013.01);
Abstract

There is provided a semiconductor device using low electric power and a small area which can realize highly accurate calibration. The semiconductor device according to the embodiment includes an A/D conversion unit, and a hold signal generating circuit which is coupled to an input side of the A/D conversion unit, and has a hold period not less than two cycles of the A/D conversion unit. The hold signal generating circuit includes: an SC integrator including an input buffer coupled to the input side of the A/D conversion unit, and feedback capacitor coupled to an input and an output of the input buffer; and a logic circuit which compares an output signal of plural bits outputted from the A/D conversion unit with a first and a second threshold values, and outputs a control signal which controls polarity of the SC integrator according to a comparison result.


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