The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2016
Filed:
Nov. 08, 2012
Applicant:
Samsung Display Co., Ltd., Yongin, Gyeonggi-Do, KR;
Inventors:
June-Woo Lee, Yongin, KR;
Jae-Beom Choi, Yongin, KR;
Kwan-Wook Jung, Yongin, KR;
Sung-Soo Choi, Yongin, KR;
Seong-Jun Kim, Yongin, KR;
Guang-Hai Jin, Yongin, KR;
Ga-Young Kim, Yongin, KR;
Jee-Hoon Kim, Yongin, KR;
Assignee:
Samsung Display Co., Ltd., Giheung-Gu, Yongin-si, Gyeonggi-do, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); G06F 3/045 (2006.01); G09G 3/00 (2006.01); G09G 3/32 (2016.01);
U.S. Cl.
CPC ...
G09G 3/006 (2013.01); G09G 3/3233 (2013.01); G09G 2300/0819 (2013.01); G09G 2300/0852 (2013.01);
Abstract
A method of inspecting a short circuit defect between first wires extending in a first direction and a second direction intersecting the first direction and second wires extending in the first or second direction, the method including inspecting a short circuit defect between the first and second wires by using a potential difference monitored only in the second wires.