The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2016

Filed:

Nov. 29, 2011
Applicants:

Ralph Highnam, Wellington, NZ;

John Michael Brady, Headington, GB;

Inventors:

Ralph Highnam, Wellington, NZ;

John Michael Brady, Headington, GB;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G06T 7/0014 (2013.01); G06T 2207/10088 (2013.01); G06T 2207/10136 (2013.01); G06T 2207/30068 (2013.01);
Abstract

The present invention relates to an imaging technique and an imaging system and more particularly to an automatic assessment of quantitative measure(s)/properties(s) of an object wherein, for example, an imaging system is used to capture an image, following which image properties are quantified using image processing techniques. An imaging technique obtains an image of an object along a first axis, or by way of a first technique, and subsequently obtains an image of the object along a second axis, or by way of a second technique. One or more pixels from the first image are selected and designated as reference pixels. An automated comparison between corresponding regions of the first and second images are then performed which is based upon the reference pixels, so as to indicate regions of interest.


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