The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2016
Filed:
May. 27, 2014
Fraunhofer-gesellschaft Zur Foerderung Der Angewandten Forschung E.v., Munich, DE;
Peter Kauff, Berlin, DE;
Christian Riechert, Berlin, DE;
Frederik Zilly, Berlin, DE;
Marcus Mueller, Berlin, DE;
Abstract
A filter structure for filtering a disparity map includes a first filter, a second filter, and a filter selector. The first filter is for filtering a contemplated section of the disparity map according to a first measure of central tendency. The second filter is for filtering the contemplated section of the disparity maps according to a second measure of central tendency. The filter selector is provided for selecting the first filter or the second filter for filtering the contemplated section of the disparity map, the selection being based on at least one local property of the contemplated section. A corresponding method for filtering a disparity map includes determining a local property of the contemplated section and selecting a filter. The contemplated section is then filtered using the first filter or the second filter depending on a result of the selection.