The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2016

Filed:

Dec. 07, 2010
Applicants:

Robert Gilchrist Jaros, Palo Alto, CA (US);

Simon Kayode Osindero, San Francisco, CA (US);

Inventors:

Robert Gilchrist Jaros, Palo Alto, CA (US);

Simon Kayode Osindero, San Francisco, CA (US);

Assignee:

Yahoo! Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06N 7/00 (2006.01); G06N 99/00 (2010.01); G06N 3/04 (2006.01); G06N 3/02 (2006.01); G06N 3/08 (2006.01);
U.S. Cl.
CPC ...
G06N 7/005 (2013.01); G06N 3/0454 (2013.01); G06N 99/005 (2013.01); G06N 3/02 (2013.01); G06N 3/08 (2013.01);
Abstract

An adaptive pattern recognition system optimizes an invariance objective and an input fidelity objective to accurately recognize input patterns in the presence of arbitrary input transformations. A fixed state or value of a feature output can nonlinearly reconstruct or generate multiple spatially distant input patterns and respond similarly to multiple spatially distant input patterns, while preserving the ability to efficiently evaluate the input fidelity objective. Exemplary networks, including a novel factorization of a third-order Boltzmann machine, exhibit multilayered, unsupervised learning of arbitrary transformations, and learn rich, complex features even in the absence of labeled data. These features are then used to classify unknown input patterns, to perform dimensionality reduction or compression.


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