The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2016

Filed:

Jun. 19, 2015
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventor:

Hiroyuki Shibata, Ashigarakami-gun, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 15/00 (2006.01); H04N 1/405 (2006.01); G06K 15/02 (2006.01); B41J 2/21 (2006.01); H04N 1/52 (2006.01);
U.S. Cl.
CPC ...
G06K 15/1881 (2013.01); B41J 2/2139 (2013.01); H04N 1/405 (2013.01); H04N 1/52 (2013.01);
Abstract

An image processing method corrects the image concentration of pixel rows adjacent to a pixel row corresponding to a masked defective recording element. Different quantization methods are performed for a first image region including the pixel row corresponding to the masked defective recording element and the pixel rows adjacent to the pixel row and a second image region other than the first image region. For at least some gradations, a first quantization pattern which is obtained by the first quantization method applied to the first image region has a pattern characteristic in which a spatial frequency component in a first direction parallel to the moving direction of a recording medium relative to the recording head is suppressed with respect to all spatial frequency components in a second direction perpendicular to the first direction, as compared to a second quantization pattern applied to the second image region.


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