The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2016

Filed:

Jan. 14, 2014
Applicant:

David E. Dehaan, Waterloo, CA;

Inventor:

David E. DeHaan, Waterloo, CA;

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30469 (2013.01); G06F 17/30442 (2013.01);
Abstract

A method and system to determine a q, θ-optimal histogram comprising a plurality of buckets over a data distribution where for any cardinality estimate made using the histogram the cardinality estimate is constrained to obey an acceptability criteria parameterized by q and θ that bounds a ratio error between the cardinality estimate and a true value of the cardinality, q being a factor by which the estimate deviates, at most, from a true value of the cardinality and θ being a threshold value which the cardinality does not exceed, wherein a maximum number of possible query intervals generated in determining the acceptability of the q, θ-optimal histogram is less than quadratic in the number of values.


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