The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2016
Filed:
Mar. 11, 2013
International Business Machines Corporation, Armonk, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Provided are techniques for interaction detection for generalized linear models. Basic statistics are calculated for a pair of categorical predictor variables and a target variable from a dataset during a single pass over the dataset. It is determined whether there is a significant interaction effect for the pair of categorical predictor variables on the target variable by: calculating a log-likelihood value for a full generalized linear model without estimating model parameters; calculating the model parameters for a reduced generalized linear model with a recursive marginal mean accumulation technique using the basic statistics; calculating a log-likelihood value for the reduced generalized linear model; calculating a likelihood ratio test statistic using the log-likelihood value for the full generalized linear model and the log-likelihood value for the reduced generalized linear model; calculating a p-value of the likelihood ratio test statistic; and comparing the p-value to a significance level.