The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2016

Filed:

May. 08, 2012
Applicants:

Kazuhito Akiyama, Tokyo, JP;

Michiharu Kudo, Tokyo, JP;

Naohiko Uramoto, Tokyo, JP;

Inventors:

Kazuhito Akiyama, Tokyo, JP;

Michiharu Kudo, Tokyo, JP;

Naohiko Uramoto, Tokyo, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/05 (2006.01); G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
G05B 19/058 (2013.01); G05B 23/0221 (2013.01); G05B 2219/14036 (2013.01);
Abstract

An anomaly detection system for detecting an anomaly in a plurality of control systems comprises a plurality of analysis devices that are associated with the respective control systems and that acquire an event occurring in an associated control system and analyze the event to determine whether there is an anomaly. A first analysis device among the plurality of analysis devices determines whether an event occurring in the associated control system is to be indicated to a second analysis device among the plurality of analysis devices, and the second analysis device determines that there is an anomaly on condition that the event indicated by the first analysis device has correlation with an event indicated by an analysis device other than the first analysis device.


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