The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2016
Filed:
Jun. 05, 2014
Applicant:
Thales-raytheon Systems Company Llc, Fullerton, CA (US);
Inventor:
Sien-Chang C. Liu, Brea, CA (US);
Assignee:
Thales-Raytheon Systems Company LLC, Fullerton, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/40 (2006.01); H01Q 3/26 (2006.01); G01S 7/00 (2006.01); G01S 13/00 (2006.01); G01S 13/02 (2006.01);
U.S. Cl.
CPC ...
G01S 7/40 (2013.01); H01Q 3/267 (2013.01); G01S 2013/0245 (2013.01);
Abstract
Methods and apparatus provide calibration of a system using a cable check configuration and a calibration test configuration. A short to ground reflects an injected signal to characterize a first signal path in the cable check configuration. Switch setting can then be adjusted to inject a signal that is coupled to an array element and received from a feed. The signal paths can be characterized to enable in-field calibration testing.