The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2016

Filed:

Jun. 26, 2012
Applicants:

John P. Mugler, Iii, Charlottesville, VA (US);

Dominik Paul, Bubenreuth, DE;

Inventors:

John P. Mugler, III, Charlottesville, VA (US);

Dominik Paul, Bubenreuth, DE;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/561 (2006.01); G01R 33/565 (2006.01);
U.S. Cl.
CPC ...
G01R 33/5617 (2013.01); G01R 33/56509 (2013.01);
Abstract

In a SPACE (Sampling Perfection with Application optimized Contrasts using different flip angle Evolutions) or equivalent magnetic resonance imaging pulse sequence, the dephasing gradient is generated (activated) so as to occur immediately in front of the second refocusing pulse, thereby eliminating the long time duration that occurs in conventional SPACE or equivalent sequences between excitation and readout. This long time duration has been identified as a source for flow-related artifacts that occur in images reconstructed from data acquired according to conventional SPACE or equivalent sequences. By eliminating this long time duration, such flow-related artifacts are substantially reduced, if not eliminated.


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