The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2016
Filed:
Dec. 19, 2013
Industrial Technology Research Institute, Hsinchu, TW;
Hui-Hsin Lu, New Taipei, TW;
Jiun-Lin Guo, Hsinchu, TW;
Wei-Hsin Wang, Taipei, TW;
Ting-Hsuan Chen, Taoyuan County, TW;
Tsung-Ter Kuo, Taichung, TW;
Industrial Technology Research Institute, Hsinchu, TW;
Abstract
An imaging system used for material discrimination of an objet is provided. The imaging system includes an X-ray source and an imaging sensor. The X-ray source generates multienergy polychromatic X-ray, wherein there is an integral-multiple relationship between the multi-energy-band of the X-ray. The object is placed between the X-ray source and the imaging sensor. The X-ray is transmitted toward and imaged by the imaging sensor through the object. An imaging multi-energy-band of the imaging sensor corresponds to the multi-energy-band of the X-ray.