The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2016

Filed:

Aug. 09, 2011
Applicants:

Karl Schreiber, Am Mellensee, DE;

Josef Geitner, Stahnsdorf, DE;

Inventors:

Karl Schreiber, Am Mellensee, DE;

Josef Geitner, Stahnsdorf, DE;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
C09D 5/03 (2006.01); C09D 5/34 (2006.01); C09D 191/00 (2006.01); C08K 3/08 (2006.01); G01N 23/04 (2006.01);
U.S. Cl.
CPC ...
G01N 23/04 (2013.01); C09D 5/032 (2013.01); C09D 5/34 (2013.01); C09D 191/00 (2013.01);
Abstract

The present invention relates to a method for radiographically inspecting a component by means of X-rays, where at least one component surface to be radiographed is provided with a surface structure, with at least the surface provided with the surface structure being smoothed by means of a smoothing material to level out the surface structure, with at least one organic compound and at least one metal powder being used as smoothing material, with the X-ray absorption behavior of the smoothing material essentially equaling the X-ray absorption behavior of the material of the component, as well as to a smoothing material for carrying out the method in accordance with Claim.


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