The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2016
Filed:
Mar. 14, 2014
The Regents of the University of California, Oakland, CA (US);
Xiaodong Tao, Santa Cruz, CA (US);
Joel A. Kubby, Bonny Doon, CA (US);
The Regents of the University of California, Oakland, CA (US);
Abstract
Interferometric focusing (IF), rather than conventional geometric focusing, of excitation light onto a guide-star that is embedded deeply in tissue, increases its fluorescence intensity. The method can extend the depth of wavefront measurement and improve correction inside of tissues because of its ability to suppress both scattering of diffuse light and aberration of ballistic light. The results showed more than two times improvement in SNR and RMS error of the wavefront measurement. Although only ballistic light in the excitation path is corrected, the intensity after wavefront correction increased by 1.5 times. When applying IF to a two-photon microscope with a near infra-red laser, this method would further extend the measurement depth and achieve high SNR for the wavefront sensor.