The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2016
Filed:
May. 01, 2014
Tomey Corporation, Nagoya-shi, Aichi-ken, JP;
Satoshi Sugiyama, Nagoya, JP;
Yuji Nozawa, Nagoya, JP;
Tomey Corporation, Nagoya-Shi, JP;
Abstract
Provided is an optical tomographic device including a measurement optical system that irradiates light from a light source to inside a subject and guides reflected light therefrom; a reference optical system that guides the light from the light source as reference light; a calibration optical system that irradiates a calibration reflecting surface with light from the light source, and guides the reflected light reflected by the calibration reflecting surface; a light-receiving element that receives the interfering light for measurement formed by synthesizing the reflected light guided by the measurement optical system and the reference light, and the interfering light for calibration formed by synthesizing the reflected light guided by the calibration optical system and the reference light; and an arithmetic logic unit that corrects the received interfering light for measurement by using an analysis result obtained by analyzing the received the interfering light for calibration.